Survey Information Management System (SIMS)

• Rapidly manages millions of data points

• Creates easy to interpret digital visual images

• Generates survey reports automatically

• Manages any and all survey data

• Overlay results on CAD drawings

Photo of area of tank removal (above); 2-D display of characterization survey data (right)

The enormous amount of survey data generated by the Surface Contamination Monitor (SCM) is effectively analyzed and managed using our Survey Information Management System (SIMS).  When SCM data is analyzed, the software algorithm considers each 25 cm² area as one-fourth of four separate 100 cm² areas.

This technique ensures that the 100 cm² area with the maximum activity is identified by eliminating the potential of missing this area due to positioning of the detector, as can occur when using handheld detectors or systems that employ multiple, non-overlapping detectors.